Title :
System reliability evaluation using concurrent multi-level simulation of structural faults
Author :
Kochte, Michael A. ; Zoellin, Christian G. ; Baranowski, Rafal ; Imhof, Michael E. ; Wunderlich, Hans-Joachim ; Hatami, Nadereh ; Di Carlo, Stefano ; Prinetto, Paolo
Author_Institution :
Inst. of Comput. Archit. & Comput. Eng., Univ. of Stuttgart, Stuttgart, Germany
Abstract :
This paper provides a methodology that leverages state-of-the-art techniques for efficient fault simulation of structural faults together with transaction level modeling. This way it is possible to accurately evaluate the impact of the faults on the entire hardware/software system.
Keywords :
circuit reliability; fault simulation; concurrent multi-level simulation; fault simulation; structural faults; system reliability evaluation;
Conference_Titel :
Test Conference (ITC), 2010 IEEE International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-7206-2
DOI :
10.1109/TEST.2010.5699309