DocumentCode :
2311498
Title :
Influence of CdCl2 treatment of CdS on the properties of electrodeposited CdS/CdTe thin film solar cells
Author :
Morris, G.C. ; Das, S.K.
Author_Institution :
Dept. of Chem., Queensland Univ., Qld., Australia
fYear :
1993
fDate :
10-14 May 1993
Firstpage :
469
Lastpage :
474
Abstract :
The effects of cadmium chloride treatment on the thin (0.2 μm) CdS layer in electrodeposited CdS/CdTe cells have been studied by comparing cell characteristics of sixteen cells with that treatment with those of sixteen cells without that treatment immediately after fabrication and after 180 days. Cells with the treated CdS layers (type A) had higher and more stable Uoc values e.g. 753±5 mV (t=0), 742±7 mV (t=180) compared with the untreated cells (type B) of 712±18 mV (t=0), 660±15 mV (t=180). CdCl2 improved the CdS crystallinity as observed from electron microscopy and inferred from optical measurements. Current-voltage-temperature measurements showed that the current transport for both sets of cells was controlled by both tunnelling and interface recombination but type A cells displayed less tunnelling. The reverse saturation current, J0 , for type A cells was 2.0±0.1 nA cm-2 (t=0 and 180) compared with type B cells for which J0 was 16 nA cm-2 (t=0) and 25 nA cm-2 (t=180). The type A cells displayed little variation of capacitance at 10 kHz with reverse bias indicating the presence of an intrinsic or low doped depletion layer present at the CdS/CdTe interface. Surface analytic studies suggested the presence of a CdSxTe1-x compound
Keywords :
II-VI semiconductors; cadmium compounds; electric current measurement; electrodeposits; electron microscopy; electron-hole recombination; semiconductor growth; semiconductor thin films; solar cells; temperature measurement; voltage measurement; CdCl2; CdCl2 treatment; CdS-CdTe; cadmium chloride treatment; capacitance; current transport; current-voltage-temperature measurements; electrodeposited CdS/CdTe thin film solar cells; electron microscopy; fabrication; interface recombination; low doped depletion layer; optical measurements; reverse saturation current; surface analytic studies; tunnelling; Cadmium compounds; Crystallization; Current measurement; Electron microscopy; Electron optics; Fabrication; Optical microscopy; Optical saturation; Spontaneous emission; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
Type :
conf
DOI :
10.1109/PVSC.1993.347136
Filename :
347136
Link To Document :
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