DocumentCode :
2311802
Title :
EMI improvement study on advanced package design
Author :
Sung, Robert ; Chiang, Kevin ; Lee, Daniel ; Chen, Carl
Author_Institution :
Siliconware Precision Ind. Co., Ltd., Taichung, Taiwan
fYear :
2010
fDate :
20-22 Oct. 2010
Firstpage :
1
Lastpage :
4
Abstract :
At the present time, the package design faces demands, including the high-speed switching, low-voltage bias and minimization. The high-speed signals may induce not only signal integrity and power integrity issues, but also cause radiation and electromagnetic interference (EMI) problems. To evaluate a package design, near-field scan is a useful technique to investigate the radiation behavior. Our study is based on this near-field approach to estimate the radiation of a package by using a simulation tool. Several factors were investigated in this study. From the near-field results, we could conclude some useful concepts for package layout design.
Keywords :
electromagnetic interference; integrated circuit packaging; EMI; electromagnetic interference; high-speed switching; low-voltage bias; near- field scan; package design; Copper; Electric fields; Electromagnetic interference; Layout; Noise; Substrates; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
Conference_Location :
Taipei
ISSN :
2150-5934
Print_ISBN :
978-1-4244-9783-6
Electronic_ISBN :
2150-5934
Type :
conf
DOI :
10.1109/IMPACT.2010.5699527
Filename :
5699527
Link To Document :
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