• DocumentCode
    2312428
  • Title

    A study of measurement methodologies for the loss characteristics of laminates and the effects of laminate features on loss-reduction for high frequency circuit applications

  • Author

    Liang, Peter

  • Author_Institution
    Tech. Dept. of Copper Clad Laminate, Nan-Ya Plastic Corp., Taiwan
  • fYear
    2010
  • fDate
    20-22 Oct. 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The prediction of dielectric loss for laminate materials in high frequency applications has become more important as clock speed increases. But down the supply chain, laminators, board fabricators, ODM and OEM design houses utilize different technique to measure the dielectric constant and loss tangent of materials. This paper studies three measurement techniques: parallel plate, transmission line, and resonant cavity; and attempts to find a suitable measurement method as standard. In addition, this paper also addresses some key factors that can influence the loss characteristics of laminates Through design modification, we can reach the goal of reducing total loss of materials and keeping cost down for high frequency applications.
  • Keywords
    dielectric loss measurement; dielectric losses; laminates; permittivity; ODM; OEM design; board fabricators; clock speed increases; design modification; dielectric constant; dielectric loss prediction; high frequency applications; high frequency circuit applications; laminate features; laminate materials; laminates; laminators; loss characteristics; loss tangent of materials; loss-reduction; measurement methodology; measurement techniques; parallel plate; resonant cavity; supply chain; transmission line; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT), 2010 5th International
  • Conference_Location
    Taipei
  • ISSN
    2150-5934
  • Print_ISBN
    978-1-4244-9783-6
  • Electronic_ISBN
    2150-5934
  • Type

    conf

  • DOI
    10.1109/IMPACT.2010.5699563
  • Filename
    5699563