Title :
Measuring distribution of carrier trap energy state density at interface of dielectric with step pressure wave method
Author :
Yewen, Zhang ; Baitun, Yang ; Demin, T.U. ; Yaonan, Liu
Author_Institution :
Dept. of Electr. Eng., Xi´´an Jiaotong Univ., China
fDate :
29 Oct-2 Nov 1989
Abstract :
The space charge at the interface of FEP-PMMA (fluorinated ethylene propylene-polymethyl methacrylate) is measured by the step pressure wave method, and the relationship between the space charge and its discharge time at room temperature is studied. Considering the dynamic process of the carrier jumping out of the trap at the interface, it is possible to determine the carrier trap energy state density distribution at the interface. It is concluded that information about carrier traps in dielectric materials can be obtained by this technique
Keywords :
contact potential; electron traps; electronic density of states; hole traps; interface electron states; organic insulating materials; polymers; space charge; FEP-PMMA interface; carrier trap energy state density distribution; dielectric materials; discharge time; dynamic process; fluorinated ethylene propylene-polymethyl methacrylate; potential distribution; space charge; step pressure wave method; Charge measurement; Current measurement; Density measurement; Dielectric materials; Energy measurement; Energy states; Pressure measurement; Space charge; Temperature; Time measurement;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1989. Annual Report., Conference on
Conference_Location :
Leesburg, VA
DOI :
10.1109/CEIDP.1989.69563
