• DocumentCode
    23151
  • Title

    Medium-Voltage Switching Transient-Induced Potential Transformer Failures: Prediction, Measurement, and Practical Solutions

  • Author

    McDermit, Daniel C. ; Shipp, David D. ; Dionise, Thomas J. ; Lorch, V.

  • Author_Institution
    Turner Constr. Co., Chicago, IL, USA
  • Volume
    49
  • Issue
    4
  • fYear
    2013
  • fDate
    July-Aug. 2013
  • Firstpage
    1726
  • Lastpage
    1737
  • Abstract
    During commissioning of a large data center, while switching medium-voltage circuit breakers without any appreciable load, several potential transformers failed catastrophically. A detailed investigation, including a computer simulation, was performed. Ferroresonance produced by switching transients associated with opening and closing the vacuum breakers was determined to be the cause. The analysis also determined that the close-coupled power transformers were also in jeopardy. Field inspections involving grounding improvements coupled with solution simulations were made. High-speed switching transient measurements were performed to verify the analysis and the surge protective device solution (arresters and snubbers). This paper walks the reader through problem recognition, simulation, field measurements, and solution implementation. Special focus will be made on the field measurement verification.
  • Keywords
    failure analysis; inspection; power transformers; surge protection; vacuum circuit breakers; close-coupled power transformers; computer simulation; data center; field inspections; field measurement verification; high-speed switching transient measurements; medium-voltage switching transient-induced potential transformer failures; surge protective device solution; switching medium-voltage circuit breakers; vacuum breakers; $RC$ snubbers; Electromagnetic Transients Program (EMTP) simulations; ferroresonance; potential transformers (PTs); surge arresters; switching transients; vacuum breakers;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2013.2258453
  • Filename
    6502686