Title :
A 256K CMOS EEPROM with enhanced reliability and testability
Author :
Do, J.Y. ; Kim, J.K. ; Lee, H.G. ; Choi, J.D. ; Lim, H.K.
Author_Institution :
Samsung Semiconductor Research and Development Center
Conference_Titel :
VLSI Circuits, 1988. Digest of Technical Papers., 1988 Symposium on
Conference_Location :
Tokyo, Japan
DOI :
10.1109/VLSIC.1988.1037434
