Title :
Soft-error characteristics in bipolar memory cells with small critical charge
Author :
Idei ; Homma, N. ; Nambu, H. ; Sakurai, Y.
Author_Institution :
Hitachi Ltd.
Conference_Titel :
VLSI Circuits, 1989. Digest of Technical Papers., 1989 Symposium on
Conference_Location :
Kyoto, Japan
DOI :
10.1109/VLSIC.1989.1037472
