Localized microwave measurement using AFM-compatible scanning nearfield microwave microscope cantilever with ultra-tall coaxial probe

Author

Karbassi, A. ; Paulson, C.A. ; Wang, Y. ; Bettermann, A. ; van der Weide, D.W.

Author_Institution

Univ. of Wisconsin- Madison, Madison

fYear

2007

fDate

9-15 June 2007

Firstpage

3336

Lastpage

3339

Abstract

We have demonstrated localized microwave measurements using SNMM cantilevers integrated with ultra-tall coaxial tips. Our results demonstrate improved electromagnetic field confinement with enhanced immunity to the parasitic capacitive coupling that is typically associated with SNMM imaging using cantilever based probes. Dielectric spectroscopy capabilities at microwave frequencies are currently being pursued for material characterization in nanometer scale.

Keywords

atomic force microscopy; electromagnetic fields; microwave measurement; probes; AFM-compatible scanning near-field microwave microscope cantilever; cantilever based probes; electromagnetic field confinement; localized microwave measurement; microwave frequencies; parasitic capacitive coupling; spectroscopy capabilities; ultratall coaxial probe; Atomic force microscopy; Coaxial components; Dielectric measurements; Electrochemical impedance spectroscopy; Electromagnetic coupling; Electromagnetic fields; Electromagnetic measurements; Microwave imaging; Microwave measurements; Probes;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 2007 IEEE

Conference_Location

Honolulu, HI

Print_ISBN

978-1-4244-0877-1

Electronic_ISBN

978-1-4244-0878-8

Type

conf

DOI

10.1109/APS.2007.4396251

Filename

4396251