Title :
Theoretical estimations of FEA´s reliability
Author :
Golubentsev, A.F. ; Anikin, V.M.
Author_Institution :
Dept. of Phys., Saratov State Univ., Russia
Abstract :
Some peculiarities of the field emission from micro- and nano-structural FEAs (e.g., a random FEA structure, a random multistable current from a single emissive center) are investigated using various Markov probabilistic models for the theoretical description of fluctuation phenomena in the field emission and reliability properties of the electron sources.
Keywords :
Markov processes; electron field emission; failure analysis; fluctuations; probability; reliability theory; statistical analysis; vacuum microelectronics; FEA reliability; Markov probabilistic models; electron sources; failure probability; field emission; field emitter arrays; fluctuation phenomena; microstructural FEA; nanostructural FEA; random multistable current; reliability properties; statistical emission models; Cathodes; Context modeling; Electron sources; Equations; Estimation theory; Fluctuations; Physics; Probability; Random processes; Reliability theory;
Conference_Titel :
Vacuum Microelectronics Conference, 1998. Eleventh International
Conference_Location :
Asheville, NC, USA
Print_ISBN :
0-7803-5096-0
DOI :
10.1109/IVMC.1998.728618
