Motion of free conducting particles in a single phase compressed gas insulated bus duct with electromagnetic field effect

Metallic particle contamination is one of the areas of insulation design that are considered critical. The management and control of particle contamination are crucial considerations as the industry moves forward to higher voltage GIS and long GITL designs using SF₆ in some components. Free conducting particles may lower the corona onset and breakdown voltage of a GIS/GITL system considerably. Under an applied electric field a conducting particle acquires a charge and lifts off from its resting position on the conductor when the electromagnetic force from the field becomes equal to the gravity force. Metallic particles move randomly in a horizontally mounted GIS/GITL system due to the electrode surface roughness and particle irregularities. Under 50 Hz AC voltage, the particle can cross the gap at a sufficiently high voltage level. Monte Carlo simulation is carried out on a single phase GIS for determining the motion of free conducting particles in the presence of electromagnetic field. The results have been presented and analyzed.