Title :
An Example of a Charge Calculation System Using the Numerical Value and Exponential Calculation of the Cellular Data System
Author :
Kodama, Toshio ; Kunii, Tosiyasu L. ; Seki, Yoichi
Author_Institution :
CDS Project, Maeda Corp., Tokyo, Japan
Abstract :
In the era of cloud computing, data is processed in a "Cloud", and data and its dependencies between systems or functions progress and change constantly within the cloud, as a user\´s requirements change. Such information worlds are called cyber worlds. We need a more powerful mathematical background which can model the cyber worlds in the "cloud"as they are. We consider the Incrementally Modular Abstraction Hierarchy (IMAH) to be appropriate for modeling the dynamically changing cyber worlds by descending from the most abstract homotopy level to the most specific view level, while preserving invariants. We have developed a data processing system called the Cellular Data System (CDS) based on IMAH. In this paper, we introduce numerical value calculation, exponential calculation and the processing maps on the presentation level of IMAH into CDS. This function is quite effective in business application development because numerical values and exponential identifiers can be put into formulas and be calculated. We show its effectiveness through examples of core processing of a cellular phone charge calculation system using numerical value and exponential calculations.
Keywords :
cellular radio; cloud computing; telecommunication computing; abstract homotopy level; business application development; cellular data system; cellular phone charge calculation system; cloud computing; cyber worlds; data processing; exponential calculation; incrementally modular abstraction hierarchy; numerical value calculation; Aging; Cellular phones; Contracts; Cyberspace; Finite element methods; Lifting equipment; exponential calculation; formula expression; incrementally modular abstraction hierarchy; numerical value calculation;
Conference_Titel :
Cyberworlds (CW), 2011 International Conference on
Conference_Location :
Banff, ON
Print_ISBN :
978-1-4577-1453-5