Measurement of ion effects on high current relativistic diodes

Author

Choi, Eun Ha ; Schneider, R.F. ; Uhm, Han S. ; Weidman, D.J. ; Freeman, W.C. ; Cordova ; Moffatt

Author_Institution

US Naval Surface Warfare Center, Silver Spring, MD, USA

fYear

1989

fDate

0-0 1989

Firstpage

82

Lastpage

83

Abstract

Summary Form only given, as follows. The influence of ion effects on high-current relativistic diodes has been theoretically investigated by E.H. Choi et al. (J. Appl. Phys., vol.61, p.2160, 1987). Experimental observations of ion effects on a relativistic diode have been carried out by the present authors by forming ions in the diode region or by using a preformed plasma in the diode. It was found that the presence of ions in the diode region suppresses the space charge and can significantly enhance the electron current (up to a factor of two). This agrees well with the theoretical results. It was also found that the relativistic electron beam within the diode may be subject to instabilities due to the presence of background ions.<>

Keywords

ion beam effects; plasma diodes; background ions; electron current; high-current relativistic diodes; instabilities; ion effects; preformed plasma; relativistic electron beam; Diodes; Ion radiation effects; Plasma devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on

Conference_Location

Buffalo, NY, USA

Type

conf

DOI

10.1109/PLASMA.1989.166078

Filename

166078