DocumentCode :
2322457
Title :
Simplifying Parametrization of Bayesian Networks in Prediction of System Quality
Author :
Omerovic, Aida ; Stolen, Ketil
Author_Institution :
SINTEF ICT, Oslo, Norway
fYear :
2009
fDate :
8-10 July 2009
Firstpage :
447
Lastpage :
448
Abstract :
Bayesian networks (BNs) are a powerful means for modelling dependencies and predicting impacts of architecture design changes on system quality. The extremely demanding parametrization of BNs is however the main obstacle for their practical application, in spite of the extensive tool support. We have promising experiences from using a tree-structured notation, that we call dependency views (DVs), for prediction of impacts of architecture design changes on system quality. Compared to BNs, DVs are far less demanding to parametrize and create. DVs have shown to be sufficiently expressive, comprehensible and feasible. Their weakness is however limited analytical power. Once created, BNs are more adaptable to changes, and more easily refined than DVs. In this paper we argue that DVs are fully compatible with BNs, in spite of different estimation approaches and concepts. A transformation from a DV to a BN preserves traceability and results in a complete BN. By defining a transformation from DVs to BNs, we have enabled reliable parametrization of BNs with significantly reduced effort, and can now exploit the strengths of both the DV and the BN approach.
Keywords :
belief networks; Bayesian networks; architecture design changes; dependency views; parametrization; system quality prediction; traceability; tree-structured notation; Bayesian methods; Calculus; Hardware; Informatics; Power system modeling; Power system reliability; Predictive models; Probability distribution; Software quality; Voltage control; Bayesian networks; System quality prediction; modelling; simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Secure Software Integration and Reliability Improvement, 2009. SSIRI 2009. Third IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3758-0
Type :
conf
DOI :
10.1109/SSIRI.2009.36
Filename :
5325336
Link To Document :
بازگشت