• DocumentCode
    232323
  • Title

    A new wrist vein biometric system

  • Author

    Das, Aruneema ; Pal, Umapada ; Ferrer Ballester, Miguel Angel ; Blumenstein, Michael

  • Author_Institution
    Inst. for Integrated & Intell. Syst., Griffith Univ., Brisbane, QLD, Australia
  • fYear
    2014
  • fDate
    9-12 Dec. 2014
  • Firstpage
    68
  • Lastpage
    75
  • Abstract
    In this piece of work a wrist vein pattern recognition and verification system is proposed. Here the wrist vein images from the PUT database were used, which were acquired in visible spectrum. The vein image only highlights the vein pattern area so, segmentation was not required. Since the wrist´s veins are not prominent, image enhancement was performed. An Adaptive Histogram Equalization and Discrete Meyer Wavelet were used to enhance the vessel patterns. For feature extraction, the vein pattern is characterized with Dense Local Binary Pattern (D-LBP). D-LBP patch descriptors of each training image are used to form a bag of features, which was used to produce the training model. Support Vector Machines (SVMs) were used for classification. An encouraging Equal Error Rate (EER) of 0.79% was achieved in our experiments.
  • Keywords
    discrete wavelet transforms; feature extraction; image classification; image enhancement; support vector machines; vein recognition; D-LBP patch descriptors; PUT database wrist vein images; SVMs; adaptive histogram equalization; bag of features; dense local binary pattern; discrete Meyer wavelet; feature extraction; image classification; image enhancement; support vector machines; wrist vein biometric system; wrist vein pattern recognition system; wrist vein pattern verification system; Adaptive equalizers; Feature extraction; Histograms; Support vector machines; Training; Veins; Wrist; Adaptive Histogram Equalization; Bag of features; Biometric; D-LBP; Discrete Meyer Wavelet; SVM; Vein Patterns;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence in Biometrics and Identity Management (CIBIM), 2014 IEEE Symposium on
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/CIBIM.2014.7015445
  • Filename
    7015445