DocumentCode :
2323582
Title :
An efficient quantification of scattering variation due to uncertain geometrical deviation
Author :
Zeng, Zhiyong ; Jin, Jian-Ming
Author_Institution :
Univ. of Illinois at Urbana-Champaign, Urbana
fYear :
2007
fDate :
9-15 June 2007
Firstpage :
4805
Lastpage :
4808
Abstract :
In this paper, the Stroud-2 and Stroud-3 cubature algorithms are applied to perform the integration for large dimensional random inputs. The scattered field variation due to randomly deviated conducting surfaces is quantified using the stochastic collocation method with the Stroud cubature and the results are compared with those by the Monte- Carlo method.
Keywords :
Monte Carlo methods; computational electromagnetics; electromagnetic wave scattering; integration; stochastic processes; Monte Carlo method; Stroud-2 cubature algorith; Stroud-3 cubature algorithm; conducting surfaces; geometrical deviation; integration; scattered field variation; scattering variation; stochastic collocation method; Computational electromagnetics; Computational geometry; Computational modeling; Computer simulation; Electromagnetic scattering; Interpolation; Radar scattering; Research and development; Solid modeling; Stochastic processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2007 IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-0877-1
Electronic_ISBN :
978-1-4244-0878-8
Type :
conf
DOI :
10.1109/APS.2007.4396619
Filename :
4396619
Link To Document :
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