• DocumentCode
    23239
  • Title

    An Analytical Formula Approximating the Multilook Interferometric-Phase Variance for InSAR

  • Author

    Baochang Liu ; Yongkang Li ; Tong Wang ; Fengyang Shen ; Zheng Bao

  • Author_Institution
    Nat. Lab. of Radar Signal Process., Xidian Univ., Xi´an, China
  • Volume
    11
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    878
  • Lastpage
    882
  • Abstract
    For interferometric synthetic aperture radar (InSAR), the second moment of interferometric phase, i.e., its variance, is a useful metric for InSAR applications (e.g., configuration design). Due to the high degree of nonlinearity in the probability density function of the multilook interferometric phase, it is extremely difficult to derive the analytical expression of the interferometric-phase variance as a function of the number of looks. However, in this letter, we will show that, if we follow an indirect route, then an analytical formula for approximating the interferometric-phase variance for any number of looks can be obtained. The key step of deriving this analytical formula is to transform the interferometric phase into the Euler domain. Simulation results show an excellent agreement between the measured variance curve and the curve obtained by the newly proposed formula except for some small coherence values.
  • Keywords
    probability; radar interferometry; synthetic aperture radar; Euler domain; InSAR; analytical formula; configuration design; high degree of nonlinearity; indirect route; interferometric phase; interferometric synthetic aperture radar; multilook interferometric-phase variance; probability density function; second moment; Accuracy; Approximation methods; Coherence; Correlation; Covariance matrices; Interferometry; Synthetic aperture radar; Interferometric phase; interferometric-phase variance; synthetic aperture radar (SAR); synthetic aperture radar interferometry (InSAR); the Cramér–Rao bound (CRB) of interferometric phase;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2013.2280671
  • Filename
    6607169