Title :
On-line Fault Detection And Correction In Microprocessor Systems
Author :
Agrawal, Dharma P. ; Agarwal, Vinod K.
Author_Institution :
Wayne State University
Keywords :
Circuit faults; Desktop publishing; Electrical fault detection; Error correction; Fault detection; Joining processes; Large scale integration; Microprocessors; Packaging; System recovery;
Conference_Titel :
Compcon Fall 79. Proceedings
DOI :
10.1109/CMPCON.1979.729089
