DocumentCode :
2324598
Title :
Final focusing of Z-discharge transported ion beams
Author :
Neri, J.M. ; Boller, J.R. ; Cooperstein, G. ; Goodrich, P.J. ; Hinshelwood, D.D. ; Mosher, D. ; Ottinger, P.F. ; Scherrer ; Stephanakis, S.J. ; Watrous, J.J. ; Young, Frederic
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
fYear :
1989
fDate :
0-0 1989
Firstpage :
89
Abstract :
Summary Form only given, as follows. An experimental program is underway at NRL to demonstrate final focusing of transported ion beams. Z-discharge channels are used to transport ion beams efficiently from the ion source to an ICF target, providing isolation and distance for time-of-flight power compression. Channel stability and beam energy loss constraints force a minimum channel diameter for a given ion beam power. Final focusing uses an additional short Z-discharge with larger current to reduce the spot size of the ion beam from the channel diameter to the target diameter. The Gamble II accelerator is used to produce a proton beam from a pinched-reflex diode. The effect of the final focus is measured with a shadowbox at the exit of the final focus cell, and the transport is measured by the /sup 19/F(p, alpha gamma ) reaction from 50% transparent Teflon screens placed in the channel. Analysis of the shadowbox damage patterns indicates that the final focus cell plasma is taken into account. The 2.54-cm-diameter ion beam from the channel is reduced in diameter to less than 1.4 cm.<>
Keywords :
discharges (electric); ion beams; /sup 19/F(p, alpha gamma ) reaction; Gamble II accelerator; ICF target; Teflon screens; Z-discharge transported ion beams; channel diameter; channel stability; channels; damage patterns; distance; final focusing; ion source; isolation; pinched-reflex diode; proton beam; shadowbox; time-of-flight power compression; Gas discharges; Ion beams;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
Conference_Location :
Buffalo, NY, USA
Type :
conf
DOI :
10.1109/PLASMA.1989.166094
Filename :
166094
Link To Document :
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