DocumentCode
2324877
Title
SSTA considering switching process induced correlations
Author
Wu, Zeqin ; Maurine, Philippe ; Azemard, Nadine ; Ducharme, Gille
Author_Institution
LIRMM, Univ. of Montpellier II, Montpellier
fYear
2008
fDate
Nov. 30 2008-Dec. 3 2008
Firstpage
562
Lastpage
565
Abstract
Statistical static timing analysis (SSTA) is becoming complicated due to introduction of more and more advanced statistical techniques. In this paper, with the help of conditional moments, we propose a simple path-based timing approach, which permits us to consider gate topology and switching process induced correlations. Numerical results are presented to quantify the relative impact of these two factors on estimation accuracy of path delay distribution.
Keywords
correlation methods; estimation theory; statistical analysis; SSTA; conditional moments; consider gate topology; estimation accuracy; path based timing approach; path delay distribution; statistical static timing analysis; switching process induced correlations; Delay estimation; Fourier series; Gaussian processes; Principal component analysis; Probability; Random variables; Statistical analysis; Threshold voltage; Timing; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on
Conference_Location
Macao
Print_ISBN
978-1-4244-2341-5
Electronic_ISBN
978-1-4244-2342-2
Type
conf
DOI
10.1109/APCCAS.2008.4746085
Filename
4746085
Link To Document