Title :
A bilateral lightwave network analyzer
Author :
Elamaran, B. ; Pollard, R.D. ; Iezekiel, Stavros
Author_Institution :
Inst. of Microwaves & Photonics, Leeds Univ., UK
Abstract :
The first reported bilateral network analyzer that is capable of two-port S-parameter measurements of all four types of lightwave components is presented. Advantages of this analyzer architecture compared to previous designs include full two-port measurements of all lightwave components with a single connection and the ability to implement self-calibration techniques. Calibrated measurement results, which prove the concept of the architecture, are also presented.
Keywords :
Calibration; Electro-optical modulation; Network analysers; Optical testing; S-parameters; analyzer architecture; bilateral lightwave network analyzer; calibrated measurement results; full two-port measurements; self-calibration techniques; two-port S-parameter measurements; Calibration; Couplers; Frequency conversion; Microwave measurements; Optical modulation; Optical receivers; Optical switches; Power combiners; Scattering parameters; Testing;
Conference_Titel :
Microwave Symposium Digest. 2000 IEEE MTT-S International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5687-X
DOI :
10.1109/MWSYM.2000.862285
