Title :
Multi-processor multi-channel PCM test system
Author :
Wong, Eddie M C ; Koh, L.M. ; Yeo, P.S.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
Abstract :
The design and development of a pulse code modulated (PCM) test system are described. For real-time signaling analysis, a TMS320C25 digital signal processor (DSP)-based card is designed to interface with the IBM PC input/output (I/O) channel. This card is designed for multichannel signal analysis and an associated software is written for multifrequency compelled (MFC) digital analysis. A chip set from Mitel is also used to interface to the 30-channel PCM (2048 kb/s) system. This card is designed to cater for clock extraction and regeneration from the PCM data, synchronization checks, time-slot selection and the extraction of signaling data which is then passed to the PC via dual-port RAMs. An onboard 80188 microprocessor is also incorporated in the design to act as a front-end processor and to initialize and control the PCM interface. Test results show that the prototype functions as expected
Keywords :
computerised signal processing; digital signal processing chips; microcomputers; multiprocessing systems; pulse-code modulation; telecommunications computing; 80188 microprocessor; DSP card; IBM PC; Mitel chips set; PCM interface; TMS320C25 digital signal processor; clock extraction; data extraction; front-end processor; multi-channel PCM test system; multi-processor test system; multifrequency compelled digit analysis; pulse code modulated; real-time signaling analysis; regeneration; synchronization checks; time-slot selection; Clocks; Data mining; Digital signal processors; Modulation coding; Phase change materials; Pulse modulation; Signal analysis; Signal design; Signal processing; System testing;
Conference_Titel :
Computer and Communication Systems, 1990. IEEE TENCON'90., 1990 IEEE Region 10 Conference on
Print_ISBN :
0-87942-556-3
DOI :
10.1109/TENCON.1990.152724
