• DocumentCode
    2328840
  • Title

    Fault tolerance through automatic cell isolation using three-dimensional cellular genetic algorithms

  • Author

    Al-Naqi, Asmaa ; Erdogan, Ahmet T. ; Arslan, Tughrul

  • Author_Institution
    Sch. of Eng. & Electron., Univ. of Edinburgh, Edinburgh, UK
  • fYear
    2010
  • fDate
    18-23 July 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    In this paper we propose a new algorithmic approach to achieve fault tolerance based on three dimensional cellular genetic algorithms (3D-cGAs). Herein, 3D architecture is targeted due to its amenability to implementation with current advanced custom silicon chip technology. The proposed approach is designed to exploit the inherent features of a cGA in which the genetic diversity is used as the key factor in identifying and isolating faulty individuals. A new migration schema is proposed as a mitigation technique. Several configurations concerning migration and selection intensity are considered. The approach is tested using four benchmark test functions and two real world problems which present different levels of difficulty. The overall results show that the proposed approach is able to cope with up to 40% soft errors (SEUs).
  • Keywords
    fault tolerant computing; genetic algorithms; statistical analysis; 3D architecture; advanced custom silicon chip technology; automatic cell isolation; benchmark test function; fault tolerance; migration schema; mitigation technique; selection intensity; three dimensional cellular genetic algorithm; Complexity theory; Entropy; Fault tolerance; Fault tolerant systems; Genetics; Hardware; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Evolutionary Computation (CEC), 2010 IEEE Congress on
  • Conference_Location
    Barcelona
  • Print_ISBN
    978-1-4244-6909-3
  • Type

    conf

  • DOI
    10.1109/CEC.2010.5586209
  • Filename
    5586209