DocumentCode
2328840
Title
Fault tolerance through automatic cell isolation using three-dimensional cellular genetic algorithms
Author
Al-Naqi, Asmaa ; Erdogan, Ahmet T. ; Arslan, Tughrul
Author_Institution
Sch. of Eng. & Electron., Univ. of Edinburgh, Edinburgh, UK
fYear
2010
fDate
18-23 July 2010
Firstpage
1
Lastpage
8
Abstract
In this paper we propose a new algorithmic approach to achieve fault tolerance based on three dimensional cellular genetic algorithms (3D-cGAs). Herein, 3D architecture is targeted due to its amenability to implementation with current advanced custom silicon chip technology. The proposed approach is designed to exploit the inherent features of a cGA in which the genetic diversity is used as the key factor in identifying and isolating faulty individuals. A new migration schema is proposed as a mitigation technique. Several configurations concerning migration and selection intensity are considered. The approach is tested using four benchmark test functions and two real world problems which present different levels of difficulty. The overall results show that the proposed approach is able to cope with up to 40% soft errors (SEUs).
Keywords
fault tolerant computing; genetic algorithms; statistical analysis; 3D architecture; advanced custom silicon chip technology; automatic cell isolation; benchmark test function; fault tolerance; migration schema; mitigation technique; selection intensity; three dimensional cellular genetic algorithm; Complexity theory; Entropy; Fault tolerance; Fault tolerant systems; Genetics; Hardware; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Evolutionary Computation (CEC), 2010 IEEE Congress on
Conference_Location
Barcelona
Print_ISBN
978-1-4244-6909-3
Type
conf
DOI
10.1109/CEC.2010.5586209
Filename
5586209
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