• DocumentCode
    2329178
  • Title

    CIM Systems In An Advanced Semiconductor Factory

  • Author

    Shibata, K.

  • Author_Institution
    OITA Works, Toshiba Corporation
  • fYear
    1994
  • fDate
    21-22 June 1994
  • Firstpage
    53
  • Lastpage
    56
  • Abstract
    The policies of CIM systems development and delivery in an advanced semiconductor factory are described, establishing a methodology for efficient production of a variety of devices. The implementation of CIM systems is expected to enhance total productivity in process and device engineering technology, wafer fabrication technology, and equipment efficiency. A dispatcher has been developed, and is presently evaluating the performance of WIP lot movements using production-line data. Production-line analysis tools are introduced and successfully utilized in quantitative analysis. A statistical fine control system (SFINCS) is developed to carry out process parameter optimization for the following lot. An expert system for fail-bit discrimination is developed. Detailed, accurate, and rapid pattern discrimination of fail-bit data is achieved.
  • Keywords
    Computer integrated manufacturing; Dynamic scheduling; Fabrication; Job shop scheduling; Manufacturing processes; Optimized production technology; Performance analysis; Production facilities; Productivity; Semiconductor device manufacture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 1994. Extended Abstracts of ISSM '94. 1994 International Symposium on
  • Conference_Location
    Tokyo, Japan
  • Type

    conf

  • DOI
    10.1109/ISSM.1994.729422
  • Filename
    729422