DocumentCode :
2329178
Title :
CIM Systems In An Advanced Semiconductor Factory
Author :
Shibata, K.
Author_Institution :
OITA Works, Toshiba Corporation
fYear :
1994
fDate :
21-22 June 1994
Firstpage :
53
Lastpage :
56
Abstract :
The policies of CIM systems development and delivery in an advanced semiconductor factory are described, establishing a methodology for efficient production of a variety of devices. The implementation of CIM systems is expected to enhance total productivity in process and device engineering technology, wafer fabrication technology, and equipment efficiency. A dispatcher has been developed, and is presently evaluating the performance of WIP lot movements using production-line data. Production-line analysis tools are introduced and successfully utilized in quantitative analysis. A statistical fine control system (SFINCS) is developed to carry out process parameter optimization for the following lot. An expert system for fail-bit discrimination is developed. Detailed, accurate, and rapid pattern discrimination of fail-bit data is achieved.
Keywords :
Computer integrated manufacturing; Dynamic scheduling; Fabrication; Job shop scheduling; Manufacturing processes; Optimized production technology; Performance analysis; Production facilities; Productivity; Semiconductor device manufacture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 1994. Extended Abstracts of ISSM '94. 1994 International Symposium on
Conference_Location :
Tokyo, Japan
Type :
conf
DOI :
10.1109/ISSM.1994.729422
Filename :
729422
Link To Document :
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