Title :
Generation Of 3-sigma Circuit Models And Its Applicaton To Statistical Worst-case Analysis Of Integrated Circuit Designs
Keywords :
Analytical models; Circuit analysis; Circuit optimization; Circuit simulation; Circuit synthesis; Integrated circuit modeling; Performance analysis; Probability; Sensitivity analysis; Statistical distributions;
Conference_Titel :
Circuits, Systems and Computers, 1977. Conference Record. 1977 11th Asilomar Conference on
DOI :
10.1109/ACSSC.1977.729473
