DocumentCode
2331714
Title
Reliability in Layered Networks with Random Link Failures
Author
Lee, Kayi ; Lee, Hyang-Won ; Modiano, Eytan
Author_Institution
Massachusetts Inst. of Technol., Cambridge, MA, USA
fYear
2010
fDate
14-19 March 2010
Firstpage
1
Lastpage
9
Abstract
We consider network reliability in layered networks where the lower layer experiences random link failures. In layered networks, each failure at the lower layer may lead to multiple failures at the upper layer. We generalize the classical polynomial expression for network reliability to the multi-layer setting. Using random sampling techniques, we develop polynomial time approximation algorithms for the failure polynomial. Our approach gives an approximate expression for reliability as a function of the link failure probability, eliminating the need to resample for different values of the failure probability. Furthermore, it gives insight on how the routings of the logical topology on the physical topology impact network reliability. We show that maximizing the min cut of the (layered) network maximizes reliability in the low failure probability regime. Based on this observation, we develop algorithms for routing the logical topology to maximize reliability.
Keywords
polynomials; telecommunication links; telecommunication network reliability; telecommunication network routing; telecommunication network topology; failure polynomial; layered networks reliability; multi-layer setting; polynomial expression; polynomial time approximation algorithms; random link failures; random sampling techniques; Algorithm design and analysis; Approximation algorithms; Circuit topology; Communications Society; Network topology; Optical fiber communication; Polynomials; Routing; Sampling methods; Telecommunication network reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
INFOCOM, 2010 Proceedings IEEE
Conference_Location
San Diego, CA
ISSN
0743-166X
Print_ISBN
978-1-4244-5836-3
Type
conf
DOI
10.1109/INFCOM.2010.5461985
Filename
5461985
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