• DocumentCode
    2331714
  • Title

    Reliability in Layered Networks with Random Link Failures

  • Author

    Lee, Kayi ; Lee, Hyang-Won ; Modiano, Eytan

  • Author_Institution
    Massachusetts Inst. of Technol., Cambridge, MA, USA
  • fYear
    2010
  • fDate
    14-19 March 2010
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    We consider network reliability in layered networks where the lower layer experiences random link failures. In layered networks, each failure at the lower layer may lead to multiple failures at the upper layer. We generalize the classical polynomial expression for network reliability to the multi-layer setting. Using random sampling techniques, we develop polynomial time approximation algorithms for the failure polynomial. Our approach gives an approximate expression for reliability as a function of the link failure probability, eliminating the need to resample for different values of the failure probability. Furthermore, it gives insight on how the routings of the logical topology on the physical topology impact network reliability. We show that maximizing the min cut of the (layered) network maximizes reliability in the low failure probability regime. Based on this observation, we develop algorithms for routing the logical topology to maximize reliability.
  • Keywords
    polynomials; telecommunication links; telecommunication network reliability; telecommunication network routing; telecommunication network topology; failure polynomial; layered networks reliability; multi-layer setting; polynomial expression; polynomial time approximation algorithms; random link failures; random sampling techniques; Algorithm design and analysis; Approximation algorithms; Circuit topology; Communications Society; Network topology; Optical fiber communication; Polynomials; Routing; Sampling methods; Telecommunication network reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    INFOCOM, 2010 Proceedings IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    0743-166X
  • Print_ISBN
    978-1-4244-5836-3
  • Type

    conf

  • DOI
    10.1109/INFCOM.2010.5461985
  • Filename
    5461985