• DocumentCode
    2333141
  • Title

    A time-dependent SPICE model for single electron box and its application to logic gates at low and high temperatures

  • Author

    Gooraji, Farzad Ahmadi ; Sharifi, Mohammad Javad ; Bahrepour, Davoud

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Shahid Beheshti Univ., Tehran, Iran
  • fYear
    2010
  • fDate
    1-3 Dec. 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, we propose a circuit model for SEB that can operate in high temperature and also in the intrinsic frequency range of these devices. This model can be used for an estimation of the bit error rate in logic applications of these devices as well.
  • Keywords
    SPICE; circuit simulation; high-temperature electronics; integrated circuit design; logic gates; single electron devices; SEB; bit error rate; circuit model; logic gate; single electron box; time-dependent SPICE model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Enabling Science and Nanotechnology (ESciNano), 2010 International Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-8853-7
  • Type

    conf

  • DOI
    10.1109/ESCINANO.2010.5701021
  • Filename
    5701021
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2333141