Title :
Strategies for functional testing of microprocessors
Author :
Noore, A. ; Weinrich, B.E.
Author_Institution :
West Virginia Univ., Morgantown, WV, USA
Abstract :
Effective strategies for generating tests for microprocessors are presented. Modular block, comprehensive instruction set, and microinstruction set approaches are proposed. These practical approaches are viable alternatives to the exhaustive testing which aims at considering all possible instructions, addressing modes and data patterns. The proposed approaches are versatile and effective, especially in the user environment
Keywords :
computer testing; logic testing; microcomputers; addressing modes; computer testing; data patterns; functional testing; logic testing; microcomputers; microinstruction set; microprocessors; modular block instruction set; Arithmetic; Logic testing; Memory management; Microprocessors; Multiplexing; Performance evaluation; Read-write memory; Registers; System testing; Virtual manufacturing;
Conference_Titel :
System Theory, 1990., Twenty-Second Southeastern Symposium on
Conference_Location :
Cookeville, TN
Print_ISBN :
0-8186-2038-2
DOI :
10.1109/SSST.1990.138184
