DocumentCode
2334426
Title
Neural network-based simulation of stress concentration factors in reliability-based optimization for mechanical components
Author
He, Lile ; Zheng, Jianxiao
Author_Institution
Mech. & Electr. Coll., Xi´´an Univ. of Archit. & Technol., Xi´´an
fYear
2009
fDate
25-27 May 2009
Firstpage
1225
Lastpage
1230
Abstract
Stress concentration damage is one of the most troublesome phenomena encountered in the practical engineering structure. In order to reduce the damage, it is very important for the stress concentration factors to determine arbitrarily and accurately. At present, more attention has been given in the problem of the stress concentration, and modern structural reliability theory and neural network technique have been improved rapidly. But it is difficult for the structural reliability problem to be solved in the case of the stress concentration. Neural network (NN) technique has been used in this work to simulate the relationship between the basic random variables and the stress concentration factors, and the explicit expression of the stress concentration factors can be obtained directly. On the basis of this, the expression of the stress concentration factors given by NN technique and reliability theory have been combined to solve the structural reliability problems in the case of the stress concentration, and then the corresponding methods of reliability analysis and optimization design have been researched in the work.
Keywords
neural nets; optimisation; reliability; stress analysis; structural engineering computing; mechanical components; neural network technique; neural network-based simulation; optimization design; reliability analysis; reliability-based optimization; stress concentration damage; stress concentration factors; structural reliability; Design methodology; Design optimization; Educational institutions; Helium; Neural networks; Perturbation methods; Random variables; Reliability engineering; Reliability theory; Stress; Neural network; Optimization Design; Reliability Analysis; Stress concentration factors; the probabilistic perturbation method;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-2799-4
Electronic_ISBN
978-1-4244-2800-7
Type
conf
DOI
10.1109/ICIEA.2009.5138397
Filename
5138397
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