DocumentCode
2335210
Title
Calorimetric calibration of spark gaps for electrostatic discharge studies
Author
Kucerovsky, Z. ; Greason, W.D. ; Flatley, M.Wm.
Author_Institution
Univ. of Western Ontario, London, Ont., Canada
Volume
3
fYear
1998
fDate
12-15 Oct. 1998
Firstpage
1746
Abstract
Spark gaps are convenient sources of electromagnetic energy, that are used for studying interactions of systems with electrostatic discharge and the electromagnetic pulse. The authors´ study focuses on the optical emission of the spark gap, which is used as a source of electromagnetic energy for studying electrostatic discharge and the electromagnetic energy pulse. The goal of their work is to measure the spark gap´s energy, contained in the optical and quasi optical regions. A reasonably simple and inexpensive method is developed for measuring the spark plug energy, which yields the value of spark plug energy in fundamental units, and which does not require complicated calibration. A spark plug signal generator and the associated apparatus are developed, suitable for industrial environment. A high sensitivity calorimeter is used for the determination of the energy contained in the spark plug optical emission. The long-term stability of the system was found to be acceptable and the system suitable for the nonintrusive characterization of optical emissions.
Keywords
calibration; calorimetry; electromagnetic pulse; electrostatic discharge; spark gaps; calorimeter; calorimetric calibration; electromagnetic energy sources; electromagnetic pulse; electrostatic discharge studies; long-term stability; nonintrusive characterization; optical emission; optical region; quasi optical region; spark gaps; spark plug energy; spark plug signal generator; Calibration; EMP radiation effects; Electromagnetic measurements; Electrostatic discharge; Electrostatic measurements; Energy measurement; Optical sensors; Plugs; Spark gaps; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location
St. Louis, MO, USA
ISSN
0197-2618
Print_ISBN
0-7803-4943-1
Type
conf
DOI
10.1109/IAS.1998.729808
Filename
729808
Link To Document