DocumentCode :
2336968
Title :
Optical Wireless OFDM System on FPGA: Study of LED Nonlinearity Effects
Author :
Stefan, Irina ; Elgala, Hany ; Mesleh, Raed ; Brien, Dominic O. ; Haas, Harald
Author_Institution :
Jacobs Univ. Bremen, Bremen, Germany
fYear :
2011
fDate :
15-18 May 2011
Firstpage :
1
Lastpage :
5
Abstract :
Nonlinearities can drastically degrade the performance of OFDM (orthogonal frequency division multiplexing) based optical wireless (OW) communication systems using intensity modulation (IM) of the optical carrier. The light emitting diode (LED) transfer function distorts the signal amplitude and forces the lower signal peaks to be clipped at the LED turn-on voltage (TOV). Additionally, the upper signal peaks can result in optical output degradation. The induced distortion can be controlled by optimizing the bias point (BP) of the LED and/or backing-off the signal power modulating the LED. In this paper, the obtained experimental results using a hardware demonstrator for OW OFDM transmission based on field programmable gate array (FPGA) and off-the-shelf analog components are presented. The conducted measurements for the bit-error performance focus on determining the optimum BP and optimizing the OFDM signal amplitude to obtain best performance. In this context, the experimental bit-error ratio (BER) is obtained as a function of the LED BP and the RMS (root mean square) OFDM signal across the LED.
Keywords :
OFDM modulation; error statistics; field programmable gate arrays; intensity modulation; light emitting diodes; optical communication; transfer functions; LED nonlinearity effects; bias point; bit error ratio; field programmable gate arrays; induced distortion; intensity modulation; light emitting diode; optical carrier; optical wireless OFDM system; root mean square OFDM signal; transfer function; Bit error rate; Light emitting diodes; Noise; OFDM; Optical distortion; Optical transmitters; Wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference (VTC Spring), 2011 IEEE 73rd
Conference_Location :
Yokohama
ISSN :
1550-2252
Print_ISBN :
978-1-4244-8332-7
Type :
conf
DOI :
10.1109/VETECS.2011.5956691
Filename :
5956691
Link To Document :
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