Title :
ON THE ACCELERATION OF TEST GENERATION ALGORlTHMS
Author :
Fujiwara, Hideo ; Shimono, Takeshi
Keywords :
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Electrical fault detection; Electronic equipment testing; Life estimation; Logic testing; System testing;
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
DOI :
10.1109/FTCSH.1995.532658
