DocumentCode :
233951
Title :
Small Signal Nonquasi-static Model for Common Double-Gate MOSFETs Adapted to Gate Oxide Thickness Asymmetry
Author :
Sharan, Neha ; Mahapatra, Santanu
Author_Institution :
Dept. of Electron. Syst. Eng., Indian Inst. of Sci., Bangalore, India
fYear :
2014
fDate :
5-9 Jan. 2014
Firstpage :
405
Lastpage :
410
Abstract :
We present a physics-based closed form small signal Nonquasi-static (NQS) model for a long channel Common Double Gate MOSFET (CDG) by taking into account the asymmetry that may prevail between the gate oxide thickness. We use the unique quasi-linear relationship between the surface potentials along the channel to solve the governing continuity equation (CE) in order to develop the analytical expressions for the Y parameters. The Bessel function based solution of the CE is simplified in form of polynomials so that it could be easily implemented in any circuit simulator. The model shows good agreement with the TCAD simulation at-least till 4 times of the cut-off frequency for different device geometries and bias conditions.
Keywords :
Bessel functions; MOSFET; polynomials; semiconductor device models; surface potential; Bessel function; Y parameters; circuit simulator; common double-gate MOSFET; continuity equation; gate oxide thickness asymmetry; polynomials; small signal nonquasistatic model; surface potentials; Adaptation models; Integrated circuit modeling; Logic gates; MOSFET; Mathematical model; Predictive models; Semiconductor device modeling; Double-Gate MOSFET; Non Quasi-Static Analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design and 2014 13th International Conference on Embedded Systems, 2014 27th International Conference on
Conference_Location :
Mumbai
ISSN :
1063-9667
Type :
conf
DOI :
10.1109/VLSID.2014.76
Filename :
6733165
Link To Document :
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