Title :
Exploring dynamics of embedded ADC through adapted digital input stimuli
Author :
Sheng, Xiaoqin ; Kerkhoff, Hans ; Zjajo, Amir ; Gronthoud, Guido
Author_Institution :
Testable Design & Testing of Integrated Syst. Group, Univ. of Twente, Enschede
Abstract :
This paper reports an evaluation of adapted digital signals as a test stimulus to test dynamic parameters of analog-to-digital converters (ADC). In the first instance, the simplest digital waveform, a pulse signal, is taken as the test stimulus. The dynamics of the device under test while applying digital signals can reflect certain faults. The method is validated by simulation of a design at the transistor level of a 6-bit flash ADC in 120 nm CMOS technology.
Keywords :
CMOS integrated circuits; analogue-digital conversion; digital signals; integrated circuit design; integrated circuit testing; CMOS technology; adapted digital input stimuli; analog-to-digital converters; digital waveform; dynamic parameter testing; pulse signal; transistor level; CMOS technology; Capacitors; Costs; Frequency; Linearity; Pulse width modulation; Semiconductor device testing; Signal generators; Signal processing; System testing;
Conference_Titel :
Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008. IEEE 14th International
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4244-2395-8
Electronic_ISBN :
978-1-4244-2396-5
DOI :
10.1109/IMS3TW.2008.4581617
