DocumentCode :
2340990
Title :
Negative ion measurements in ECR plasmas
Author :
Bon-Woong Koo ; Gon-Ho Kim ; Hershkowitz, N. ; Meyer, J. ; Gross, S. ; En-Yao Wang
Author_Institution :
Wisconsin Univ., Madison, WI, USA
fYear :
1995
fDate :
5-8 June 1995
Firstpage :
219
Abstract :
Summary form only given, as follows. An omegatron mass analyzer was modified and employed in detecting negative ions in an Electron Cyclotron Resonance (ECR) etching plasma, operating at a pressure of 0.3/spl sim/10 mTorr. Plasma is permitted to flow through a biased aperture along the magnetic field and an end plate is biased negatively. The negative ions emerging from the aperture encounter transverse RF electric fields applied inside the omegatron chamber, while most positive ions are collected at the end plate. Peaks in the collected current, transverse to the magnetic field occur as a result of cyclotron resonance. The polarity of the peaks depends on the charge of the ion species. The redesigned omegatron mass spectrometer includes differential pumping which can make the inside pressure of the omegatron below the 10/sup -4/ Torr range reducing the effect of collision within the omegatron. Preliminary results show H/sup +/, H/sub 2//sup +/, H/sub 3//sup +/, H/sup -/ and H/sub 2//sup -/ in hydrogen, O/sup +/, O/sub 2//sup +/, O/sup -/ and O/sub 2//sup -/ in oxygen, F/sup -/ and NF/sup -/ in NF/sub 3/ ECR plasmas. Recent experiments with CF/sub 4/ and NF/sub 3/ plasmas are described.
Keywords :
cyclotron resonance; mass spectroscopy; negative ions; plasma diagnostics; plasma properties; sputter etching; 0.3 to 10 mtorr; ECR plasmas; F; H; H/sub 2/; H/sub 2//sup +/; H/sub 2//sup -/; H/sub 3/; H/sub 3//sup +/; H/sup +/; H/sup -/; NF; NF/sub 3/; O; O/sub 2/; O/sub 2//sup +/; O/sub 2//sup -/; O/sup +/; O/sup -/; biased aperture; collected current; collision; differential pumping; end plate; etching plasma; ion species; magnetic field; negative ions; omegatron chamber; omegatron mass analyzer; tetrafluoromethane; transverse RF electric fields; Apertures; Cyclotrons; Electrons; Etching; Magnetic analysis; Magnetic field measurement; Magnetic resonance; Noise measurement; Plasma applications; Plasma measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-2669-5
Type :
conf
DOI :
10.1109/PLASMA.1995.532792
Filename :
532792
Link To Document :
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