Data driven architecture for mixed signal ATE to improve CAD connectivity

Author

Tsuboshita, Hirofumi ; Furukawa, Yasuo

Author_Institution

Advantest Corp., Saitama, Japan

fYear

1994

fDate

10-12 May 1994

Firstpage

1463

Abstract

This paper describes outlines of a tester architecture designed to simplify test designs of mixed signal devices. It also describes the results of integration the test environment to the CAD environment by application of the object oriented technology to controls of the test systems. It also describes the fact that, as a secondary effect of this architecture, the throughput of tests has been improved more than double the previous figures

Keywords

CAD; automatic test equipment; computer architecture; mixed analogue-digital integrated circuits; object-oriented methods; signal processing; signal processing equipment; CAD connectivity; CAD environment; data driven architecture; integration; mixed signal ATE; mixed signal devices; object oriented technology; test environment; tester architecture; throughput; Control systems; Design automation; Digital signal processing; Frequency measurement; Measurement units; Process design; Signal design; Signal processing; System testing; Throughput;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE

Conference_Location

Hamamatsu

Print_ISBN

0-7803-1880-3

Type

conf

DOI

10.1109/IMTC.1994.352173

Filename

352173