DocumentCode :
2342762
Title :
Materials Studies With TeraH/sub z/ Beams
Author :
Grischkowsky, D.
Author_Institution :
IBM Watson Research Center
fYear :
1990
fDate :
16-20 July 1990
Firstpage :
11
Lastpage :
12
Keywords :
Absorption; Conductivity; Dielectric losses; Dielectric measurements; Dielectric substrates; Dispersion; Silicon; Temperature; Transmission line measurements; Transmission line theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nonlinear Optics: Materials, Phenomena and Devices, 1990. Digest. NLO '90.
Conference_Location :
Kauai, HI, USA
Type :
conf
DOI :
10.1109/NLO.1990.695812
Filename :
695812
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2342762
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