Title :
Timing accuracy in VLSI testing
Author :
Pavlik, E. ; Vuksic, A.
Author_Institution :
Siemens AG, Munich, West Germany
Abstract :
Timing errors arising during VLSI device testing are reviewed. Particular attention is given to internal tester errors caused by the characteristics of the hardware and the autocalibration procedure used, and application-related errors in DC testing, function testing, and AC testing (testing of dynamic parameters). It is concluded that extremely expensive testers or testers highly geared to specific characteristics are not necessarily the most economical or most cost-effective solution, not even for standard applications
Keywords :
VLSI; automatic test equipment; automatic testing; calibration; integrated circuit testing; measurement errors; AC testing; DC testing; IC testing; VLSI testing; autocalibration; cost; dynamic parameters; function testing; internal tester errors; timing accuracy; timing errors; Accuracy; Clocks; Integrated circuit modeling; Integrated circuit testing; Large scale integration; Manufacturing; Production; Propagation delay; Timing; Very large scale integration;
Conference_Titel :
European Test Conference, 1989., Proceedings of the 1st
Conference_Location :
Paris
Print_ISBN :
0-8186-1937-6
DOI :
10.1109/ETC.1989.36229
