• DocumentCode
    234371
  • Title

    3D face recognition using facial curves, sparse random projection and fuzzy similarity measure

  • Author

    Belghini, Naouar ; Ezghari, Soufiane ; Zahi, Azeddine

  • Author_Institution
    Syst. Intell. & Applic. Lab. (SIA, FST, Fez, Morocco
  • fYear
    2014
  • fDate
    20-22 Oct. 2014
  • Firstpage
    317
  • Lastpage
    322
  • Abstract
    In this paper, we propose a fuzzy similarity based classification approach for 3D face recognition. In the feature extraction method, we exploit curve concept to represent the 3D facial data, two types of curves was considered: depth-level and depth-radial curves. As the dimension of the obtained features is high, the problem “curse of dimensionality” appears. To solve this problem, the Random Projection (RP) method was used. The proposed classifier performs Fuzzification operation using triangular membership functions for input data and ordered weighted averaging operators to measure similarity. Experiment was conducted using vrml files from 3D Database considering only one training sample per person. The obtained results are very promising for depth-level and depth-radial curves, besides the recognition rates are higher than 98%.
  • Keywords
    face recognition; feature extraction; fuzzy set theory; image classification; 3D database; 3D face recognition; 3D facial data; RP method; depth-level curves; depth-radial curves; dimensionality curse; facial curves; feature extraction method; fuzzification operation; fuzzy similarity based classification; ordered weighted averaging operators; random projection method; sparse random projection; triangular membership functions; vrml files; Abstracts; Decision support systems; Face recognition; Feature extraction; Knowledge based systems; Pragmatics; Three-dimensional displays; 3D face recognition; OWA operator; facial curves; fuzzy logic; similarity measure; sparse random projection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Science and Technology (CIST), 2014 Third IEEE International Colloquium in
  • Conference_Location
    Tetouan
  • Print_ISBN
    978-1-4799-5978-5
  • Type

    conf

  • DOI
    10.1109/CIST.2014.7016639
  • Filename
    7016639