DocumentCode :
2343801
Title :
Yield increase of VLSI after redundancy-repairing
Author :
Hirase, Junichi
fYear :
2001
fDate :
2001
Firstpage :
353
Lastpage :
358
Abstract :
A topic of great concern in VLSI manufacture is yield. One way to improve practical yield is to design redundant memory or logic circuits and switch over to this redundant circuit if fault occurs in the principle memory or main logic circuit. This paper reports the repairing ratio of no good devices on the main circuit and how large of a redundancy-repairing circuit would be economically feasible
Keywords :
VLSI; integrated circuit yield; integrated logic circuits; integrated memory circuits; probability; redundancy; IC yield; VLSI manufacture; redundancy-repairing circuit; redundant logic circuits; redundant memory circuits; yield increase; Circuit faults; Distribution functions; Fabrication; Logic circuits; Manufacturing industries; Poisson equations; Power generation economics; Switches; Switching circuits; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location :
Kyoto
ISSN :
1081-7735
Print_ISBN :
0-7695-1378-6
Type :
conf
DOI :
10.1109/ATS.2001.990308
Filename :
990308
Link To Document :
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