DocumentCode
2344239
Title
Built-in self-test for state faults induced by crosstalk in sequential circuits
Author
Shimizu, Kazuya ; Itazaki, Noriyoshi ; Kinoshita, Kozo
Author_Institution
Graduate Sch. of Eng., Osaka Univ., Japan
fYear
2001
fDate
2001
Firstpage
469
Abstract
With the movement into deep submicron (DSM) technology and GHz clock frequencies, signal integrity problems have become important. Signal integrity problems are induced by circuit noise such as crosstalk, power supply noise. substrate noise. In this paper, we consider crosstalk in such noise and propose a new built-in self-test method for faults induced by crosstalk, called crosstalk faults
Keywords
VLSI; automatic testing; built-in self test; crosstalk; fault diagnosis; integrated circuit testing; logic testing; sequential circuits; built-in self-test method; crosstalk; crosstalk faults; deep submicron technology; gigahertz clock frequencies; sequential circuits; signal integrity problems; state faults; Built-in self-test; Circuit faults; Circuit noise; Circuit testing; Clocks; Crosstalk; Delay; Polynomials; Sequential circuits; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2001. Proceedings. 10th Asian
Conference_Location
Kyoto
ISSN
1081-7735
Print_ISBN
0-7695-1378-6
Type
conf
DOI
10.1109/ATS.2001.990336
Filename
990336
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