Title :
Negative bulk mobility devices - what next?
Author :
Kroemer, Herbert
Author_Institution :
Electr. Eng. Dept., Univ. of Colorado, Boulder, CO, USA
Abstract :
The transferred-electron (=TE) type negative differential bulk mobility (=NDBM) of the Gunn Effect in GaAs has formed one of the cornerstones of a rapidly growing solid-state microwave technology. Reliable solid-state microwave oscillators with several hundred milliwatts of low-noise c.w. power at X-band are commercially available, as are lower-power oscillators up to at least 70 GHz, and amplifiers to at least half the latter frequency. While these developments have by no means reached their inherent limits yet, new approaches to NDBM are already being explored, to take over where the present ones leave off. In this paper we wish to review briefly three such approaches, in the order of an increasingly speculative nature.
Keywords :
Gunn devices; Gunn effect; III-V semiconductors; carrier mobility; gallium arsenide; low-power electronics; microwave oscillators; Gunn effect; NDBM; X-band; amplifiers; low-noise CW power; lower-power oscillators; negative bulk mobility devices; reliable solid-state microwave oscillators; solid-state microwave technology; transferred-electron type negative differential bulk mobility; Gallium arsenide; Indium phosphide; Microwave amplifiers; Microwave oscillators; Superconducting microwave devices; Superlattices;
Conference_Titel :
Electron Devices Meeting (IEDM), 1974 International
Conference_Location :
Washington, DC
DOI :
10.1109/IEDM.1974.6219617