DocumentCode :
2344597
Title :
Extensions of the effective thickness theory of oxide breakdown
Author :
Coleman, Donald J., Jr. ; Hunter, William R. ; Brown, George A. ; Chen, Lh-Chin
Author_Institution :
Texas Instrum., Dallas, TX, USA
fYear :
1989
fDate :
11-13 Apr 1989
Firstpage :
39
Lastpage :
42
Abstract :
The effective thickness concept of oxide breakdown is generalized to a causal time-to-breakdown function, depending only on effective electric field. The function is approximated by a linear and inverse exponential electric-field dependence and applied differentially to data obtained in a pair of step stress tests. The effective thickness distribution is evaluated in both cases and found to be independent of the form chosen. The actual electric-field dependence of the time-to-breakdown function is measured and can be fit with either form over the small range of effective electric fields encountered in the highly accelerated tests. The analysis technique using a pair of tests is presented to illustrate that the effective thickness theory does not require a particular form for the time-to-breakdown function. It demonstrates that the defect density function can be fully obtained at highly accelerated conditions, sampling only a small range of high electric fields. The technique does not of itself allow extrapolation to lower electric fields even though the distribution in effective thickness is known
Keywords :
electric breakdown of solids; high field effects; life testing; metal-insulator-semiconductor structures; silicon compounds; SiO2; accelerated tests; causal time-to-breakdown function; defect density function; effective electric field; effective thickness theory; electric-field dependence; high electric fields; oxide breakdown; step stress tests; thickness distribution; Acceleration; Density functional theory; Electric breakdown; Electric variables measurement; Extrapolation; Life estimation; Linear approximation; Sampling methods; Stress; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1989. 27th Annual Proceedings., International
Conference_Location :
Phoenix, AZ
Type :
conf
DOI :
10.1109/RELPHY.1989.36315
Filename :
36315
Link To Document :
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