Title :
An Intelligent Vision System for Inspection of SMDS
Author :
Teoh, E.K. ; Mital, D.P. ; Lee, B.W. ; Wee, L.K.
Author_Institution :
Nanyang Technological University
Keywords :
Fault detection; Frequency; Histograms; Inspection; Intelligent systems; Machine vision; Soldering; Strips; Surface-mount technology; Testing;
Conference_Titel :
Emerging Technologies and Factory Automation, 1992. IEEE International Workshop on
Print_ISBN :
0-7803-0886-7
DOI :
10.1109/ETFA.1992.683322
