DocumentCode :
2345810
Title :
Mode stabilization of 850 nm vertical cavity lasers by Si diffusion & disordering
Author :
Thornton, R.L. ; Yao Zou ; Hibbs-Brenner, M. ; Morgan, R.A.
Author_Institution :
Xerox Palo Alto Res. Center, CA, USA
fYear :
1996
fDate :
26-26 June 1996
Firstpage :
92
Lastpage :
93
Abstract :
In this paper we present results on a vertical cavity laser structure which provides fundamental mode operation by way of a fully planar diffusion based process. By selective Si diffusion and disordering, we are able to pattern the upper p-mirror, resulting in suppressed reflectivity of higher order modes relative to the fundamental mode. For a 5 /spl mu/m device diameter, we have obtained a threshold current of 3.8 mA and single mode operation over the entire operating range for the device, with a peak single mode power of 0.63 mW, at a drive current of 6 mA. A 5 /spl mu/m apertured implanted (non-diffused) structure with otherwise similar processing had a threshold current of 5.7 mA, and exhibited multimode operation for output power above 40 /spl mu/W.
Keywords :
diffusion; laser modes; laser stability; optical fabrication; silicon; surface emitting lasers; 850 nm; Si diffusion; disordering; fabrication; mode stabilization; p-mirror; reflectivity; threshold current; vertical cavity laser; Apertures; Indium tin oxide; Laser modes; Laser stability; Optical filters; Optical losses; Temperature; Threshold current; Vertical cavity surface emitting lasers; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 1996. Digest. 54th Annual
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-3358-6
Type :
conf
DOI :
10.1109/DRC.1996.546327
Filename :
546327
Link To Document :
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