DocumentCode :
2345999
Title :
A new concept of ballasting mechanisms of microwave power transistors in class C operation
Author :
Sayed, M.M. ; Chen, J.T.C. ; Kakihana, S.
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
fYear :
1974
fDate :
9-11 Dec. 1974
Firstpage :
302
Lastpage :
304
Abstract :
Emitter ballasting in class C microwave power transistors is shown to cause a sacrifice of output power and collector efficiency. The use of base impedance balasting resulted in the development of an experimental 4 GHz microwave power transistor which is capable of providing 3 watts of output power with a 6.4 dB power gain and a 65% collector efficiency. The experimental data on the collector current dependence of the power gain, and the spatial temperature distribution of the device working in class C and class A operations are presented. General guidelines for designing class C microwave transistors for optimum performance are given.
Keywords :
electric impedance; microwave power transistors; base impedance ballasting; class C microwave power transistors; class-A operation; collector current dependence; collector efficiency; emitter ballasting; frequency 4 GHz; power gain; spatial temperature distribution; Electronic ballasts; Microwave amplifiers; Microwave transistors; RNA; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 1974 International
Conference_Location :
Washington, DC
ISSN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.1974.6219751
Filename :
6219751
Link To Document :
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