DocumentCode :
23469
Title :
Resistance Scaling From 10 {\\rm k}\\Omega Up to 100 {\\rm T}\\Omega With New Designs of
Author :
Lisowski, Marcin ; Krawczyk, Kamil
Author_Institution :
Inst. of Electr. Eng. Fundamentals, Wroclaw Univ. of Technol., Wroclaw, Poland
Volume :
62
Issue :
6
fYear :
2013
fDate :
Jun-13
Firstpage :
1749
Lastpage :
1754
Abstract :
This paper describes the realization of a new system for resistance scaling from 10 kΩ to 100 TΩ. The resistance unit has been transferred from the quantum hall resistance (QHR) primary resistance standard to the resistance standard with a nominal value of 10 kΩ by a cryogenic current comparator. For further transfer of the resistance unit from 10 kΩ to 100 TΩ, Hamon transfer devices (Hamon networks) are used. For its complete realization five devices have been developed: 10-100-1000 kΩ, 1-10-100 MΩ, 0.1-1-10 GΩ , 10-100-1000 GΩ, and 1-10-100 TΩ. The first two devices have a single insulation, and the next three have a double isolation. In the transfer devices with the double insulation, triax-type connectors are used. All transfer devices have individual temperature stabilization within ±0.01°C. In the paper, the factors influencing device accuracy have been described. The insulation leakage is recognized, and the error caused by it is calculated. The guarding network for the new design of Hamon transfer devices is presented. Voltage coefficients of resistance and settling times of resistors used in these devices have been determined and discussed. Uncertainties for the Hamon transfer devices ratios have been calculated. Calibration results have been presented. The developed system is currently tested in the Central Office of Measures in Poland.
Keywords :
calibration; cryogenics; current comparators; electric resistance measurement; insulation; measurement errors; measurement standards; measurement uncertainty; quantum Hall effect; Hamon transfer device; calibration; cryogenic current comparator; insulation leakage; isolation; measurement error; measurement uncertainty; quantum hall resistance; resistance 0.1 Gohm to 10 Gohm; resistance 1 Mohm to 100 Mohm; resistance 1 Tohm to 100 Tohm; resistance 10 Gohm to 1000 Gohm; resistance 10 kohm to 100 Tohm; resistance 10 kohm to 1000 kohm; resistance scaling; resistance standard; resistance unit; resistor settling time; temperature stabilization; triax-type connector; voltage coefficient; Hamon transfers; measurement; measurement standards; measurement techniques; measurement uncertainty; precision measurements; uncertainty;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2013.2250132
Filename :
6502712
Link To Document :
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