DocumentCode
2347804
Title
Enhancing Stakeholder Profiles to Improve Recommendations in Online Requirements Elicitation
Author
Castro-Herrera, Carlos ; Cleland-Huang, Jane ; Mobasher, Bamshad
Author_Institution
Syst. & Requirements Eng. Center, DePaul Univ., Chicago, IL, USA
fYear
2009
fDate
Aug. 31 2009-Sept. 4 2009
Firstpage
37
Lastpage
46
Abstract
Requirements elicitation has long been recognized as a crucial activity in any software development project. Unfortunately, the traditional elicitation practices do not scale well when applied to larger projects, where knowledge is distributed across numerous geographically dispersed stakeholders. As a result, new distributed requirements elicitation tools have started to surface, such as online forums and wiki pages. In our previous work, we introduced a framework for supporting distributed elicitation by utilizing data mining and machine learning techniques to automatically group stakeholder ideas into forums, and by using recommender system technologies to help promote these forums to potentially interested stakeholders. The framework is designed to create an open and more inclusive environment where points of view, conflicts, interests and tradeoffs are identified as early as possible. In this paper, we present two substantial enhancements to the Recommender System component of this framework, and demonstrate through experiments how they improve the quality of the recommendations.
Keywords
data mining; information filters; software engineering; systems analysis; data mining; distributed elicitation; machine learning; online requirements elicitation; recommender system technologies; software development project; stakeholder profiles; Collaboration; Collaborative tools; Collaborative work; Data mining; Large-scale systems; Machine learning; Programming; Recommender systems; Systems engineering and theory; Yarn; Elicitation; Recommender Systems; Requirements;
fLanguage
English
Publisher
ieee
Conference_Titel
Requirements Engineering Conference, 2009. RE '09. 17th IEEE International
Conference_Location
Atlanta, GA
ISSN
1090-705X
Print_ISBN
978-0-7695-3761-0
Type
conf
DOI
10.1109/RE.2009.20
Filename
5328640
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