On the Field Patterns in Elliptic-Shaped Microshield Lines Loaded with Left-Handed Materials by the Edge-Based Finite Element Method

Author

Hai Sun

Author_Institution

Sch. of Math. & Informational Sci., Leshan Normal Univ., Leshan, China

fYear

2014

fDate

15-16 Nov. 2014

Firstpage

330

Lastpage

333

Abstract

The field patterns in elliptic-shaped microshield lines loaded with left-handed materials are analyzed by edge-based finite element method. The left-handed material is defined by assigning to it a negative permittivity and negative permeability simultaneously. The field patterns include the dominant mode and the first higher-order mode. Some illustrated figures provided in this paper are considered useful in novel microwave and millimeter devices.

Keywords

electromagnetic fields; electromagnetic shielding; finite element analysis; microwave devices; microwave metamaterials; millimetre wave devices; permeability; permittivity; edge-based finite element method; elliptic-shaped microshield lines; field patterns; left-handed materials; microwave devices; millimeter devices; negative permeability; negative permittivity; Finite element analysis; Metamaterials; Microwave circuits; Microwave integrated circuits; Optical waveguides; edge-based finite element method; elliptic-shaped microshield lines; field patterns;

fLanguage

English

Publisher

ieee

Conference_Titel

Computational Intelligence and Security (CIS), 2014 Tenth International Conference on

Conference_Location

Kunming

Print_ISBN

978-1-4799-7433-7

Type

conf

DOI

10.1109/CIS.2014.34

Filename

7016911