• DocumentCode
    2349334
  • Title

    AVF Analysis Acceleration via Hierarchical Fault Pruning

  • Author

    Maniatakos, Michail ; Tirumurti, Chandra ; Jas, Abhijit ; Makris, Yiorgos

  • Author_Institution
    EE Dept., Yale Univ., New Haven, CT, USA
  • fYear
    2011
  • fDate
    23-27 May 2011
  • Firstpage
    87
  • Lastpage
    92
  • Abstract
    The notion of Architectural Vulnerability Factor (AVF) has been extensively used by designers to evaluate various aspects of design robustness. While AVF is a very accurate way of assessing element resiliency, its calculation requires rigorous and extremely time-consuming experiments. In response, designers have introduced various methodologies that allow AVF calculation within reasonable time, at the cost of some loss of accuracy. In this paper, we present a method for calculating the AVF of design elements-using Statistical Fault Injection (SFI)-with equal accuracy but several orders of magnitude faster than traditional SFI techniques. Our method partitions the design into various hierarchical levels and systematically performs incremental fault injections to generate the AVF numbers. The presented method has been applied on an Intel microprocessor, where experimental results corroborate its ability to achieve great speed-up while maintaining perfect accuracy in calculating AVF.
  • Keywords
    computer architecture; fault tolerant computing; microprocessor chips; statistical analysis; systems analysis; AVF analysis; Intel microprocessor; SFI techniques; architectural vulnerability factor; hierarchical fault pruning; incremental fault injections; statistical fault injection; Accuracy; Algorithm design and analysis; Analytical models; Latches; Logic gates; Microprocessors; Out of order;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2011 16th IEEE European
  • Conference_Location
    Trondheim
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4577-0483-3
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETS.2011.42
  • Filename
    5957928